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IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, ... FinFET reliability: From device level stress to product HTOLChangze Liu, ...
Published in: 2015 IEEE International Reliability Physics Symposium ... Date Added to IEEE Xplore: 01 June 2015 ... DOI: 10.1109/IRPS.2015.7112692.
IEEE 2015 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, ... Miaomiao; Liu, Zuoguang; Yamashita, Tenko; Stathis, James H.; Chen, ...
Miaomiao Wang, Zuoguang Liu, Tenko Yamashita, James H. Stathis, Chia-Yu Chen: Separation of interface states and electron trapping for hot carrier ...
IEEE International Reliability Physics Symposium (IRPS) Soft Error Committee ... JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B 33(2) 2015年3月 査読有り.
P. Moens, C. Liu, A. Banerjee, P. Vanmeerbeek, P. Coppens, H. Ziad, A. Constant et al., An industrial process for 650 V rated ... (IRPS), June 2015, pp.
DOI: 10.1109/IRPS.2014.6861125 Chen C-C, Liu T, Milor L. System-level modeling ... 2015;55(9-10):1290-1296 Liu T, Chen C-C, Milor L. Accurate standard cell ...
IEEE International Reliability Physics Symposium (IRPS) ... Wen Liu, Globalfoundries ... In 2015, he moved to Intel Labs and became responsible for.
... in 2015 IEEE International of Reliability Physics Symposium (IRPS) (2015), ... 21.3.1–21.3.4 W. Wang, S. Yang, S. Bhardwaj, S. Vrudhula, F. Liu, Y. Cao, ...
15, 4553–4556 (2015) Khan, A.I., Chatterjee, K., Duarte, J.P., Lu, Z., ... In: 2013 IEEE International Reliability Physics Symposium (IRPS) (2013) 39. 40.

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